| QUOTE | Cell Chart Explanatory Notes
Devices included in this chart of the current state of the art have efficiencies that are confirmed by independent, recognized test labs—e.g., NREL, AIST, JRC-ESTI, and Fraunhofer-ISE—and are reported on a standardized basis. The measurements for new entries must be with respect to Standard Test or Reporting Conditions as defined by the global reference spectrum for flat-plate devices and the direct reference spectrum for concentrator devices as listed in standards IEC 60904-3 edition 2 or ASTM G173. The reference temperature is 25°C, and the area is the cell total area or the area defined by an aperture.
Cell efficiency results are provided within families of semiconductors:
Multijunction cells
Single-junction gallium arsenide cells
Crystalline silicon cells
Thin-film technologies
Emerging photovoltaics.
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| QUOTE | The most recent world record for each technology is highlighted along the right edge in a flag that contains the efficiency and the symbol of the technology. The company or group that fabricated the device for each most-recent record is bolded on the plot.
The information plotted by NREL is provided in good faith, but NREL cannot accept direct responsibility for any errors or omissions. The plot is not copyrighted and may be used in presentations and publications, with a notation that states: "This plot is courtesy of the National Renewable Energy Laboratory, Golden, CO." |
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